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This came about in a meeting with the .NET team about trace depth.
We know that a lot of customers mostly just use automatic instrumentation and maybe add some metadata to the current span here or there. We also know that some customers go all-in on tracing and instrument very deeply.
It would be useful to look at a distribution of num_spans_per_trace and then slice & dice this based on another dimension, like which language they're instrumenting with for OTel, or something else.
The text was updated successfully, but these errors were encountered:
This came about in a meeting with the .NET team about trace depth.
We know that a lot of customers mostly just use automatic instrumentation and maybe add some metadata to the current span here or there. We also know that some customers go all-in on tracing and instrument very deeply.
It would be useful to look at a distribution of
num_spans_per_trace
and then slice & dice this based on another dimension, like which language they're instrumenting with for OTel, or something else.The text was updated successfully, but these errors were encountered: